論文(2017年)

学術論文

  1. “Large perpendicular exchange bias and high blocking temperature in Al-doped Cr2O3/Co thin film systems”
    T. Nozaki, Y Shiokawa, Y. Kitaoka, Y. Kota, H. Imamura, M. Al-Mahdawi, S. P. Pati, S. Ye, S. Yonemura, T. Shibata, and M. Sahashi
    Applied Physics Express, vol. 10, pp. 073003-1 - 073003-4, 2017.6.
  2. “Control of spin-reorientation transition in (0001) oriented alpha-Fe2O3 thin film by external magnetic field and temperature”
    S. P. Pati, M. Al-Mahdawi, S. Ye, T. Nozaki, and M. Sahashi
    Physica Status Solidi Rapid Research Letters, pp. 1700101-1 - 1700101-5, 2017.5. (issue and page numbers not yet assigned.)
  3. “Magnetoelectric switching energy in Cr2O3/Pt/Co perpendicular exchange coupled thin film system with small Cr2O3 magnetization”
    T. Nozaki, M. Al-Mahdawi, S. P. Pati, S. Ye, Y. Shiokawa, and M. Sahashi
    Japanese Journal of Applied Physics Rapid Communication, vol. 56, pp. 070302-1 - 070302-4, 2017.6.
  4. “Low-energy magnetoelectric control of domain states in exchange-coupled heterostructures”
    M. Al-Mahdawi, S. P. Pati, Y. Shiokawa, S. Ye, T. Nozaki, and M. Sahashi
    Physical Review B, vol. 95, pp. 144423-1 - 144423-9, 2017.4.
  5. “Control of lateral ferromagnetic domains in Cr2O3/Pt/Co thin film system with positive exchange bias”
    T. Nozaki, M. Al-Mahdawi, S. P. Pati, S. Ye, and M. Sahashi
    Applied Physics Letters, vol.110, pp. 132408-1 - 132408-5, 2017.3.
  6. ”Observation of perpendicular exchange bias in an Ir-doped Fe2O3/Co ultrathin film system”
    S. Ye, S. P. Pati, Y. Shiokawa, M. Al-Mahdawi, T. Nozaki, and M. Sahashi
    Physical Chemistry Chemical Physics, vol. 19, pp. 8188 - 8193, 2017.3.
  7. “Apparent critical behaviour of sputter-deposited magnetoelectric antiferromagnetic Cr2O3 films near Neel temperature”
    M. Al-Mahdawi, Y. Shiokawa, S. P. Pati, S. Ye, T. Nozaki, and M. Sahashi
    Journal of Physics D: Applied Physics, vol. 50, pp. 155004-1 - 155004-8, 2017.3.
  8. “Enhancing the blocking temperature of perpendicular-exchange biased Cr2O3 thin films using buffer layers”
    N. Shimomura, S. P. Pati, T. Nozaki, T. Shibata, and M. Sahashi
    AIP Advances, vol. 7, 025212-1 - 025212-9, 2017.2.
  9. “Electric field effect on the Neel temperature of cobalt oxide formed at an alumina nano-oxide layer”
    M. Al-Mahdawi and M. Sahashi
    Appl. Phys. Express, vol. 10, pp. 023001-1 - 023001-3, 2017.1.
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